|
Advanced Data Profiling Techniques
|
![]() Ed Lindsey
Senior Consultant
Informatica
|
|
March 6, 2007
3:15 PM - 4:15 PM
Level: Advanced
Rigorous data profiling precedes every successful data integration initiative, and routine profiling of integrated data helps sustain data quality over time. Explore data profiling tips and techniques using metadata frequency distribution, patterns, data structure, data standardization, calculations, business rules, and referential integrity independent of specific tools. In this session, you'll learn specific techniques for dealing with challenging fields including dollar amounts, dates, social security numbers, and multi-use fields.
A seasoned engineer and consultant, Mr. Lindsey has worked intensively with data profiling standards, tools, and techniques for the last six years. He is a master of many formal and informal profiling tools, including Informatica Data Explorer (formerly known as Similarity Axio), Informatica Data Quality (formerly known as Similarity Athanor), ProfileStage, dfPower Tools, Access, SQL, and Excel. He has worked with customers across a broad range of industries, including financial services, telecommunications, government, consumer goods, and insurance. Mr. Lindsey joins Informatica recently from Similarity Systems. Earlier in his career, he worked for NCR Teradata developing business solutions centered on data warehousing and for AT&T Bell Laboratories developing high availability transaction processing (HATP) systems for the telecommunications industry.
|